The Quantified EM NDE project will investigate how to maximise the information from EM NDE techniques. Broadly split into three work packages, it will involve the formulation of algorithms and machine learning for signal processing of high-resolution inspection processes, as well as seeking to understand the fundamental relationships between time and frequency domain EM inspections.

Finally we will experiment with the application of high-density EM arrays for tomographic inversion to recover quantified defect parameters in inspection problems